11:15 11:30 | Shot noise in disordered graphene samples |
| P. Marconcini (1), D. Logoteta(2) and M. Macucci(1) |
| (1) Dipartimento di Ingegneria dell’Informazione, Università di Pisa, Via Caruso 16, 56122 Pisa, Italy (2) Dipartimento di Ingegneria dell’Informazione, Elettronica e Telecomunicazioni (DIET), Università di Roma La Sapienza, via Eudossiana 18, 00184 Roma |
11:30 11:45 | Engineering of Charge Current Flow in Nanoporous Graphenes |
| I. Alcón(1), A. Cummings(1) and S. Roche(1,2) |
| (1)Catalan Institute of Nanoscience and Nanotechnology (ICN2), Campus UAB, Bellaterra, 08193 Barcelona, Spain (2)ICREA, Institució Catalana de Recerca i Estudis Avançats, 08070 Barcelona, Spain |
11:45 12:00 | Recombination Time in Drift-Diffusion Models of Graphene Field-Effect Transistors |
| Pedro C. Feijoo (1,2), Ferney A. Chaves(2) and David Jiménez(2) |
| (1) Departamento de Matemática Aplicada a la Ingenería Industrial, C/José Gutiérrez Abascal 2, 28006 Madrid, Universidad Politécnica de Madrid (2) Departament d’Enginyeria Electrònica, C/ de les Sitges s/n, 08193 Cerdanyola del Vallès (Barcelona), Universitat Autònoma de Barcelona, Spain |
12:00 12:15 | Numerical simulation of terahertz carrier dynamics in monolayer MoS2 |
| Shuva Mitra, Laleh Avazpour, and Irena Knezevic |
| Department of Electrical and Computer Engineering University of Wisconsin-Madison, Madison, WI 53706, USA |
12:15 12:30 | Quantum Transport Study of Metal-TMD Contacts: Role of the Dielectric Environment |
| Pranay Kumar Reddy Baikadi(1), Peter Reyntjens(1,2), Maarten L. Van de Put(2) and William G. Vandenberghe(1) |
| (1)Department of Materials Science and Engineering, The University of Texas, Dallas, TX, USA (2)Department of Material Engineering, KU Leuven, Belgium |
12:30 12:45 | Electrothermal Properties of 2D Materials |
| S. Klein(1), Z. Aksamija(2) |
| (1) University of Massachusetts, Amherst, MA, USA, (2) University of Utah, Salt Lake City, UT, USA |
12:45 13:00 | First-principles study of water molecules at the electrified graphene surface |
| Hyeonwoo Yeo, Juho Lee, Ryong Gyu Lee, Seunghyun Yu, and Yong-Hoon Kim |
| School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Korea |